“Optimizing Control Factors for Threshold Voltage and Leakage Current in 32 nm PMOS Transistors with the Taguchi Method”, Ly. J. App. Sci. Tech., vol. 12, no. 1, pp. 82–91, Jun. 2024, Accessed: Jun. 14, 2026. [Online]. Available: https://www.ljast.ly/ojs3504/index.php/ljast/article/view/6